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Quality aspects in spatial data mining [electronic resource] / editors, Alfred Stein, John Shi, Wietske Bijker.

Contributor(s): Stein, Alfred | Shi, John | Bijker, Wietske, 1965-Material type: TextTextPublication details: Boca Raton, FL : Chapman & Hall/CRC, 2008. Description: 374 pISBN: 9781420069273 (ebook : PDF)Subject(s): Geographic information systems | Spatial analysis (Statistics)Genre/Form: Electronic books.Additional physical formats: No titleOnline resources: Click here to access online Also available in print edition. CRC Press (http://www.crcpress.com)
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Includes bibliographical references and index.

Also available in print edition. CRC Press (http://www.crcpress.com)

Mode of access: World Wide Web.

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