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			Handbook of natural language processing [electronic resource] / [edited by] Nitin Indurkhya and Fred J. Damerau. by Indurkhya, Nitin \| Damerau, Frederick J. (Frederick Jacob), 1931-. Series: Chapman & Hall/CRC machine learning & pattern recognition series ; 2.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boca Raton : Taylor & Francis, 2010Online access: Click here to access online Availability: No items available. Place hold Add to cart (remove)
			Ensemble methods [electronic resource] : foundations and algorithms / Zhi-Hua Zhou. by Zhou, Zhi-Hua, Ph. D. Series: Chapman & Hall/CRC machine learning & pattern recognition seriesMaterial type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boca Raton, Fla. : CRC Press, 2012Online access: Click here to access online Availability: No items available. Place hold Add to cart (remove)
			Multi-label dimensionality reduction / Liang Sun, Shuiwang Ji, and Jieping Ye. by Sun, Liang [author.] \| Ji, Shuiwang [author.] \| Ye, Jieping [author.]. Series: Chapman & Hall/CRC machine learning & pattern recognition seriesMaterial type: Text; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, [2014]Copyright date: �2014Online access: Click here to access online Availability: No items available. Place hold Add to cart (remove)
			Bayesian programming / Pierre Bessiere, CNRS, Paris, France, Emmanuel Mazer, CNRS, Grenoble, France, Juan-Manuel Ahuactzin, ProbaYes, Puebla, Mexico, Kamel Mekhnacha, ProbaYes, Grenoble, France. by Bessi�ere, Pierre [author.]. Series: Chapman & Hall/CRC machine learning & pattern recognition seriesMaterial type: Text; Format: available online ; Literary form: Not fiction Publisher: Boca Raton : Taylor & Francis, [2014]Copyright date: �2014Online access: Click here to access online Availability: No items available. Place hold Add to cart (remove)
			Bayesian programming / Pierre Bessiere, CNRS, Paris, France, Emmanuel Mazer, CNRS, Grenoble, France, Juan-Manuel Ahuactzin, ProbaYes, Puebla, Mexico, Kamel Mekhnacha, ProbaYes, Grenoble, France. by Bessi�ere, Pierre [author.]. Series: Chapman & Hall/CRC machine learning & pattern recognition seriesMaterial type: Text; Format: available online ; Literary form: Not fiction Publisher: Boca Raton : Taylor & Francis, [2014]Copyright date: �2014Online access: Click here to access online Availability: No items available. Place hold Add to cart (remove)
			Multi-label dimensionality reduction / Liang Sun, Shuiwang Ji, and Jieping Ye. by Sun, Liang [author.] \| Ji, Shuiwang [author.] \| Ye, Jieping [author.]. Series: Chapman & Hall/CRC machine learning & pattern recognition seriesMaterial type: Text; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, [2014]Copyright date: �2014Online access: Click here to access online Availability: No items available. Place hold Add to cart (remove)

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